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I. Basic Information for CVE-2017-18651
Vulnerability Information
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Vulnerability Title
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Description
An issue was discovered on Samsung mobile devices with M(6.x) and N(7.x) software. There is an Integer Overflow in process_M_SetTokenTUIPasswd during handling of a trusted application, leading to memory corruption. The Samsung IDs are SVE-2017-9008 and SVE-2017-9009 (October 2017).
Source: NVD (National Vulnerability Database)
CVSS Information
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Type
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Title
Samsung移动设备输入验证错误漏洞
Source: CNNVD (China National Vulnerability Database)
Vulnerability Description
Samsung Mobile Device是韩国Samsung公司的一系列移动智能设备。 Samsung移动设备（搭载Android M(6.x)和N(7.x)）中的process_M_SetTokenTUIPasswd存在输入验证错误漏洞。攻击者可利用该漏洞导致内存损坏。
Source: CNNVD (China National Vulnerability Database)
CVSS Information
N/A
Source: CNNVD (China National Vulnerability Database)
Vulnerability Type
N/A
Source: CNNVD (China National Vulnerability Database)
Affected Products
VendorProductAffected VersionsCPESubscribe
-n/a n/a -
II. Public POCs for CVE-2017-18651
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III. Intelligence Information for CVE-2017-18651
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IV. Related Vulnerabilities
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Same vendor: n/a
V. Comments for CVE-2017-18651

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