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I. Basic Information for CVE-2017-18655
Vulnerability Information
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Vulnerability Title
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Description
An issue was discovered on Samsung mobile devices with M(6.0) and N(7.x) software. There is a stack-based buffer overflow with resultant memory corruption in a trustlet. The Samsung IDs are SVE-2017-8889, SVE-2017-8891, and SVE-2017-8892 (August 2017).
Source: NVD (National Vulnerability Database)
CVSS Information
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Type
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Title
Samsung移动设备缓冲区错误漏洞
Source: CNNVD (China National Vulnerability Database)
Vulnerability Description
Samsung Mobile Device是韩国Samsung公司的一系列移动智能设备。 Samsung移动设备（搭载Android M(6.0)和N(7.x)）中的Trustlet存在缓冲区错误漏洞，该漏洞源于程序没有对缓冲区进行边界检查。攻击者可利用该漏洞导致内存损坏。
Source: CNNVD (China National Vulnerability Database)
CVSS Information
N/A
Source: CNNVD (China National Vulnerability Database)
Vulnerability Type
N/A
Source: CNNVD (China National Vulnerability Database)
Affected Products
VendorProductAffected VersionsCPESubscribe
-n/a n/a -
II. Public POCs for CVE-2017-18655
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III. Intelligence Information for CVE-2017-18655
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IV. Related Vulnerabilities
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Same vendor: n/a
V. Comments for CVE-2017-18655

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