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I. Basic Information for CVE-2018-5210
Vulnerability Information

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Vulnerability Title
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Description
On Samsung mobile devices with N(7.x) software and Exynos chipsets, attackers can conduct a Trustlet stack overflow attack for arbitrary TEE code execution, in conjunction with a brute-force attack to discover unlock information (PIN, password, or pattern). The Samsung ID is SVE-2017-10733.
Source: NVD (National Vulnerability Database)
CVSS Information
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Type
N/A
Source: NVD (National Vulnerability Database)
Vulnerability Title
Samsung移动设备缓冲区错误漏洞
Source: CNNVD (China National Vulnerability Database)
Vulnerability Description
Samsung mobile devices是韩国三星(Samsung)公司生产的智能移动设备。Android L、M和N是美国谷歌(Google)公司和开放手持设备联盟(简称OHA)共同开发的一套以Linux为基础的不同版本的开源操作系统。Exynos chipsets是韩国三星(Samsung)公司基于ARM架构设计研发的处理器。 使用Andriod N(7.x)和Exynos芯片的Samsung移动设备中存在缓冲区溢出漏洞。攻击者可利用该漏洞执行任意代码,并获取PIN、密码或模式信息。
Source: CNNVD (China National Vulnerability Database)
CVSS Information
N/A
Source: CNNVD (China National Vulnerability Database)
Vulnerability Type
N/A
Source: CNNVD (China National Vulnerability Database)
Affected Products
VendorProductAffected VersionsCPESubscribe
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II. Public POCs for CVE-2018-5210
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III. Intelligence Information for CVE-2018-5210
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IV. Related Vulnerabilities
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